INDUSTRY FIELD GUIDE
Semiconductor device data for AI wafer and die-map evidence
SEMI publishes semiconductor-industry standards.
NAICS 334413 · Semiconductor and Related Device Manufacturing
SEMI publishes semiconductor-industry standards. A device manufacturer can propose an original task that preserves the relationship among a wafer, a die position and the test record supplied. SEMI standards context
Draw a fictional wafer map and create an explicitly defined coordinate glossary. Split selected die references into two packaging lots. Ask the assistant which test observations belong to a selected output. Include a map viewed from the opposite orientation and a proposed allocation that was not executed. The key should follow the recorded transfer and supplied coordinate convention.
Annotate wafer, die coordinate, view orientation, test version, transfer event and package lot. Hold out a new grid and identifier scheme for evaluation. Score rotated-coordinate errors, use of the proposed allocation and missing transfer branches independently. A complete case should support the association without exposing any real design or process information.
Use self-authored maps and invented readings. Customer intellectual property, proprietary tests, licensed standards and outside reports require explicit authority. Describe the map-and-lineage task and qualified reviewer key to prospective buyers. Their accepted brief should guide further preparation of operating records or authorized new material.
Discuss this original manufacturing sample with Fiund
Original Fiund exercise
Translate row and column without inventing a second die
An original paper wafer grid uses a notch and numbered cells. No fabrication information or real test results appear.
| Record | Source | What it records |
|---|---|---|
| 1 | Coordinate glossary | In image B the 180° rotation maps board row r to 5−r and column c to 5−c on a 4×4 grid. |
| 2 | Test map | Toy indication at board row 1, column 3. |
| 3 | Image B | Visible annotation at image row 4, column 2. |
Question for the model
Are these records consistent with one location?
Show the reference answer and checks
Yes. Applying record 1 to board row 1 and column 3 yields image row 4 and column 2, matching record 3. Keep one location with two coordinate frames rather than counting two separate indications. The notch documents which transform was used.
- Comparing untransformed coordinates
- Swapping row and column during rotation
Fields to preserve
- board_die_coordinate
- Stable location key
- image_coordinate
- Stores view-specific annotation
- transform_version
- Makes the mapping auditable
Test another case
Use a mirrored instead of rotated view and require applying its distinct transform.
Paper grid only; no wafer layouts, semiconductor recipes, production data or yield claims.
Discuss a contribution
Describe the sources you control, the task they could support and what has already been checked. Use the existing-data assessment for an archive or the collection brief for a new recording project. The contributor agreement defines Fiund’s licensing authority and compensation. A guide or fictional exercise does not establish an accepted collection or a sale.