INDUSTRY FIELD GUIDE
Cut-and-sew apparel data for AI seam inspection
A seam can follow the right line and still pucker.
NAICS 315210 · Cut and Sew Apparel Contractors
NAICS 315250 · Cut and Sew Apparel Manufacturing (except Contractors)
A seam can follow the right line and still pucker. If your team inspects garments, those are two separate judgments worth recording. NIST benchmarks robotic manipulation of deformable objects, which is relevant when fabric changes shape between views. micro1 has advertised paid first-person capture in manufacturing. Ask whether sewing or inspection is currently in scope before planning production. NIST deformable-object benchmark · micro1 workplace recording listing
Show the fabric before and after it relaxes
Use an original, unbranded swatch with a marked reference line. Photograph the flat panel with scale, then photograph it released from the fixture. Include a puckered seam, a visibly off-line seam, and an acceptable seam in similar fabric. A reviewer can mark the region and reason for each judgment. Keep a different fabric construction out of training if the buyer wants to see whether the system learned seam features instead of weave patterns.
A contractor needs separate clearance from the brand or design owner for any production pattern, tech pack, or sample garment. Employee permission and factory approval also matter for recordings. A neutral seam exercise avoids copying a client style or filming near a running needle.
Start with three sewn swatches and the inspector’s labels. Describe a collection
Original Fiund exercise
Two visible seam conditions in one stitch run
A handmade patch is photographed flat and unstretched with an overlaid reference line. Two portions show different visible features.
| Record | Source | What it records |
|---|---|---|
| S1 | Overlay legend | Target line follows the dotted guide; the scale marks 1 mm increments. |
| S2 | Segment A detail | Stitch path moves 4 mm off the guide; adjacent cloth lies flat. |
| S3 | Segment B detail | Stitches stay on the guide; adjacent cloth visibly ripples. |
| S4 | Work card | No allowable deviation or pucker grading scale is given. |
Question for the model
Label each segment and state which judgment is unavailable.
Show the reference answer and checks
Record a 4 mm path offset on A using S1 and S2, with no visible ripple in that view. Record visible puckering on B using S3 while retaining its on-guide stitch path. S4 prevents converting either observation into a rejection or acceptance decision.
- One generic defect label for visually distinct conditions
- Converting an observed offset to a failing grade without a tolerance
Fields to preserve
- segment_id
- Ties labels to precise portions of the stitch run
- path_offset_mm
- Quantifies displacement separately from surface shape
- tension_state
- Marks whether the observation was made on unstretched cloth
Test another case
Use an oblique image without a scale. Keep a qualitative observation if supported and abstain from millimeters.
Exclude commercial tech packs, factory videos and claims about sewing setup or finished-product durability.
Discuss a contribution
Describe the sources you control, the task they could support and what has already been checked. Use the existing-data assessment for an archive or the collection brief for a new recording project. The contributor agreement defines Fiund’s licensing authority and compensation. A guide or fictional exercise does not establish an accepted collection or a sale.