{
  "title": "Semiconductor machinery data for AI event and revision matching",
  "source_page": "https://fiund.com/industries/semiconductor-tool-event-revision-data",
  "authorship": "Original fictional Fiund editorial exercise. No actual operating records or third-party source assets are included.",
  "example": {
    "title": "The event code changed meaning across firmware versions",
    "context": "An invented tool event glossary uses generic office-state labels. No process, equipment control or fabrication instructions appear.",
    "records": [
      [
        "1",
        "Glossary",
        "Code E4 means queued under rev A, acknowledged under rev B."
      ],
      [
        "2",
        "Event export",
        "Row 1 E4 rev A; row 2 E4 rev B."
      ],
      [
        "3",
        "Dashboard draft",
        "Both rows decoded as acknowledged using latest glossary."
      ]
    ],
    "question": "How should the rows be decoded?",
    "answer": "Row 1 means queued and row 2 means acknowledged under the version-specific definitions in records 1 and 2. Record 3 is correct only for row 2. Keep the firmware revision with each event so later glossary updates cannot silently rewrite old states.",
    "failureModes": [
      "Decoding every code using the latest glossary",
      "Counting code equality as semantic equality"
    ],
    "fields": [
      [
        "firmware_revision",
        "Selects the correct definition"
      ],
      [
        "event_code",
        "Preserves the raw token"
      ],
      [
        "decoded_state",
        "Stores version-specific meaning"
      ]
    ],
    "holdout": "Give one row with a missing revision and overlapping deployment dates; require an unresolved decode.",
    "boundary": "No actual fabrication recipes, semiconductor tool configuration, proprietary logs or controls."
  }
}