{
  "title": "Measuring device data for AI reference-object association",
  "source_page": "https://fiund.com/industries/measuring-device-reference-object-data",
  "authorship": "Original fictional Fiund editorial exercise. No actual operating records or third-party source assets are included.",
  "example": {
    "title": "Reference bias estimates depend on the exact artifact",
    "context": "A mock instrument measures paper reference objects. Values and labels are fictional.",
    "records": [
      [
        "1",
        "Artifact register",
        "Object A reference 10 units; object B reference 12."
      ],
      [
        "2",
        "Observation",
        "Device D4 measured object B as 13."
      ],
      [
        "3",
        "Draft calculation",
        "Uses object A's reference and reports +3."
      ]
    ],
    "question": "What observed difference should be recorded?",
    "answer": "For object B, 13 − 12 gives +1 unit from records 1 and 2. Record 3 uses the wrong artifact's reference. Store the +1 comparison for this observation without extending it to a general calibration status for D4.",
    "failureModes": [
      "Using a neighboring artifact's reference",
      "Inferring overall instrument accuracy from one observation"
    ],
    "fields": [
      [
        "reference_object_id",
        "Joins observation to the correct target"
      ],
      [
        "assigned_reference_value",
        "Provides comparison basis"
      ],
      [
        "observed_difference",
        "Stores the computed result at its scope"
      ]
    ],
    "holdout": "Use two assigned values for object B at different dates and select the effective value when observed.",
    "boundary": "No actual metrology procedures, calibration certificates, tolerances or instrument recommendations."
  }
}