{
  "title": "Electronic component data for AI crystal and test references",
  "source_page": "https://fiund.com/industries/electronic-crystal-test-reference-data",
  "authorship": "Original fictional Fiund editorial exercise. No actual operating records or third-party source assets are included.",
  "example": {
    "title": "A reference change invalidates a raw comparison",
    "context": "Fictional crystal-unit cards report offsets in arbitrary units. There are no actual frequency or operating specifications.",
    "records": [
      [
        "1",
        "Reference table",
        "Reference R2 is 4 units above R1."
      ],
      [
        "2",
        "Test A",
        "Unit X reports +2 relative to R1."
      ],
      [
        "3",
        "Test B",
        "Unit Y reports −1 relative to R2."
      ]
    ],
    "question": "Which reading is higher when both are expressed relative to R1?",
    "answer": "Y is +3 relative to R1 after adding the 4-unit R2 offset to −1. X remains +2 in that frame. Use records 1–3 together, and retain both original references because the raw signs alone would suggest the opposite order.",
    "failureModes": [
      "Comparing signed offsets without their references",
      "Assuming a negative local value remains negative after normalization"
    ],
    "fields": [
      [
        "reference_id",
        "Identifies the local zero"
      ],
      [
        "raw_offset",
        "Preserves the reported value"
      ],
      [
        "reference_transform",
        "Supports a common comparison"
      ]
    ],
    "holdout": "Use an R2 reference value documented for a different time interval; require applicable reference evidence before normalizing.",
    "boundary": "No actual crystal specs, oscillator design, calibration or performance claims."
  }
}