{
  "title": "Computer manufacturing data for AI build and test configuration",
  "source_page": "https://fiund.com/industries/computer-build-test-configuration-data",
  "authorship": "Original fictional Fiund editorial exercise. No actual operating records or third-party source assets are included.",
  "example": {
    "title": "A hardware swap puts the older test out of scope",
    "context": "Fictional computer cards describe an invented build manifest and mock reports.",
    "records": [
      [
        "1",
        "Build 1",
        "Unit U2 with board A and memory M1; test T1 completed."
      ],
      [
        "2",
        "Build 2",
        "U2 changed to memory M2; board A unchanged."
      ],
      [
        "3",
        "Report T2",
        "Names U2/A/M2 but is marked pending."
      ]
    ],
    "question": "Which test status applies to the current build?",
    "answer": "T2 is the configuration-specific record for U2/A/M2 from records 2 and 3, and its status remains pending. T1 belongs to U2's earlier M1 build. Reusing the same system serial and board does not transfer completed test status through the memory change.",
    "failureModes": [
      "Joining by system serial only",
      "Treating a pending report as a passed test"
    ],
    "fields": [
      [
        "configuration_fingerprint",
        "Combines versioned components"
      ],
      [
        "build_event",
        "Orders the hardware change"
      ],
      [
        "test_status",
        "Preserves the state for each configuration"
      ]
    ],
    "holdout": "Use two different component orderings representing the same build and canonicalize keys without ignoring version changes.",
    "boundary": "No actual device architecture, benchmarks, customer identifiers or repair instructions."
  }
}