{
  "title": "Circuit board assembly rework data for AI inspection",
  "source_page": "https://fiund.com/industries/circuit-assembly-rework-data",
  "authorship": "Original fictional Fiund editorial exercise. No actual operating records or third-party source assets are included.",
  "example": {
    "title": "The same reference designator changes state after rework",
    "context": "An original paper board uses neutral reference positions. There is no actual electronics rework instruction.",
    "records": [
      [
        "1",
        "Before image",
        "Board B7 position R4 has visible tilted paper token."
      ],
      [
        "2",
        "Rework log",
        "A replacement event recorded for B7/R4 at 11:20."
      ],
      [
        "3",
        "After image",
        "At 11:30 B7/R4 token appears aligned; surrounding positions not shown."
      ]
    ],
    "question": "How should the two views appear in a training record?",
    "answer": "Retain the tilted observation before the event and the aligned observation after it for B7/R4, using all three records. The later image supersedes neither the historical label nor evidence for neighboring positions. It does not establish electrical functionality.",
    "failureModes": [
      "Deduplicating before and after as contradictory copies",
      "Using post-event appearance as a functional test"
    ],
    "fields": [
      [
        "board_serial",
        "Pairs views of the same assembly"
      ],
      [
        "reference_designator",
        "Locates the feature"
      ],
      [
        "event_relative_time",
        "Distinguishes pre- and post-rework state"
      ]
    ],
    "holdout": "Record a second rework event without an after view; leave that latest visual state unverified.",
    "boundary": "No real circuit diagrams, repair procedures, electrical tests or customer board images."
  }
}
